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Modular SOC testing with reduced wrapper count

✍ Scribed by Qiang Xu; Nicolici, N.

Book ID: 117907425
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 833 KB
Volume: 24
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2005.852447

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