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Modifications by rare gas bombardment of aluminium nitride formed by direct implantation

โœ Scribed by S. Lucas; F. Bodart; G. Terwagne; G. Sorensen; H. Jensen


Book ID
103952594
Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
418 KB
Volume
2
Category
Article
ISSN
0921-5107

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โœฆ Synopsis


It is well known that nitrogen implantation into aluminium increases the hardness of the aluminium surface owing to the )brmation of crystalline aluminium nitride.

In order to enhance the thickness of the aluminium nitride formed during nitrogen implantation in pure aluminium, the samples were implanted with I~N,+ ions successively at different energies between 100 and 320 keV. The implanted specimens were investigated by nuclear reaction analysis', Rutherford backscattering spectroscopy and scanning electron microscopy.

Post-irradiations with Kr + ions at doses of l ร— ]017 ions cm : and an energy of 500 keV were performed, and it was shown that the krypton ion bombardment redis'tributed the implanted nitrogen; so a morn homogeneous aluminium nitride layer was formed.


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