Modelling topographical artifacts in scanning near-field optical microscopy
β Scribed by Oliver Fenwick; Gianluca Latini; Franco Cacialli
- Book ID
- 116897269
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 80 KB
- Volume
- 147
- Category
- Article
- ISSN
- 0379-6779
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π SIMILAR VOLUMES
Apertureless scanning near-field optical microscopy (SNOM) in the reflection-back-to-the-fiber configuration is possible on rough surfaces of practical importance and reaches 15 nm lateral resolution. The feedback for constant distance mode is provided by shear-force atomic force microscopy. Any art
## Abstract This manuscript reviews the principles and recent advances of scanning nearβfield optical microscopy based on tipβinduced field enhancement. These scanning microscopes utilize minute probes to locally enhance an electromagnetic field through a complex interplay between surface plasmon e