Topographical artifacts and optical resolution in near-field optical microscopy
โ Scribed by Bozhevolnyi, Sergey I.
- Book ID
- 115395221
- Publisher
- Optical Society of America
- Year
- 1997
- Tongue
- English
- Weight
- 205 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0740-3224
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Apertureless scanning near-field optical microscopy (SNOM) in the reflection-back-to-the-fiber configuration is possible on rough surfaces of practical importance and reaches 15 nm lateral resolution. The feedback for constant distance mode is provided by shear-force atomic force microscopy. Any art
## Abstract By using an expectationโmaximization maximum likelihood estimation algorithm to improve the lateral resolution of a recently developed nonโinterferometric wideโfield optical profilometer, we obtain superโresolution brightโfield optical images of nanometer features on a flat surface. The