Modelling of integrated circuit defect sensitivities : C. H. Stapper. IBM Jl Res. Dev.27 (6), 549 (Novemeber 1983)

• Book ID: 103276211
• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 120 KB
• Volume: 24
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(84)90248-8