Modelling of integrated circuit defect sensitivities: C. H. Stapper IBM JI Res. Dev. 27 (6), 549 (November 1983)

• Book ID: 104157436
• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 97 KB
• Volume: 17
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(86)80042-8