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Modelling of 18O tracer studies of the oxygen redistribution during formation of SiO2 layers by high dose implantation

✍ Scribed by H.U. Jager; J.A. Kilner; R.J. Chater; P.L.F. Hemment; R.F. Peart; K.J. Reeson

No coin nor oath required. For personal study only.

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