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Modelling imperfections of epitaxial heterostructures by means of X-ray diffraction analysis

✍ Scribed by Q. Liu; W. Prost; A. Brennemann; U. Auer; F. J. Tegude

Publisher
Italian Physical Society
Year
1997
Tongue
English
Weight
311 KB
Volume
19
Category
Article
ISSN
0392-6737

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