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Study of X-ray diffraction pictures of crystal imperfections by means of a triple interferometer

✍ Scribed by Aboyan, A. O. ;Bezirganyan, P. A. ;Khzardzhyan, A. A.

Publisher: John Wiley and Sons
Year: 1990
Tongue: English
Weight: 636 KB
Volume: 118
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211180103

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