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Modeling, testing, and analysis for delay defects and noise effects in deep submicron devices

✍ Scribed by Jing-Jia Liou; Krstic, A.; Yi-Ming Jiang; Kwang-Ting Cheng

Book ID: 118698383
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 639 KB
Volume: 22
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2003.811442

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