Langevin forces and generalized transfer fields for noise modeling in deep submicron devices

✍ Scribed by Shiktorov, P.; Starikov, E.; Gruzinskis, V.; Gonzalez, T.; Mateos, J.; Pardo, D.; Reggiani, L.; Varani, L.; Vaissiere, J.C.

• Book ID: 114538307
• Publisher: IEEE
• Year: 2000
• Tongue: English
• Weight: 200 KB
• Volume: 47
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.870587