[IEEE SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Cambridge, MA, USA (8-10 Sept. 1997)] SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Accurate models for CMOS scaling and gate delay in deep sub-micron regime

✍ Scribed by Kai Chen, ; Chenming Hu, ; Peng Fang, ; Gupta, A.; Ming Ren Lin, ; Wollesen, D.L.

• Book ID: 118272675
• Publisher: IEEE
• Year: 1997
• Tongue: English
• Weight: 289 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780780337756
• DOI: 10.1109/sispad.1997.621387