Modeling of the 1/f noise overshoot in short-channel MOSFETs locally degraded by hot-carrier injection

✍ Scribed by Boukriss, B.; Haddara, H.; Cristoloveanu, S.; Chovet, A.

• Book ID: 119957833
• Publisher: IEEE
• Year: 1989
• Tongue: English
• Weight: 290 KB
• Volume: 10
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/55.43091