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Modeling of SOI-MOS capacitors C-V behavior: partially- and fully-depleted cases

✍ Scribed by Ikraiam, F.A.; Beck, R.B.; Jakubowski, A.

Book ID: 114537259
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 164 KB
Volume: 45
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.669517

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