✦ LIBER ✦

[IEEE 2010 IEEE International SOI Conference - San Diego, CA, USA (2010.10.11-2010.10.14)] 2010 IEEE International SOI Conference (SOI) - Comparison between the behavior of submicron graded-channel SOI nMOSFETs with fully- and partially-depleted operations in a wide temperature range

✍ Scribed by de Souza, M.; Emam, M.; Vanhoenacker-Janvier, D.; Raskin, J.-P.; Flandre, D.; Pavanello, M. A.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2010 IEEE International SOI Confer

✍ Mazurier, J.; Weber, O.; Andrieu, F.; Allain, F.; Tabone, C.; Toffoli, A.; Fenou 📂 Article 📅 2010 🏛 IEEE ⚖ 667 KB

[IEEE 2010 IEEE International SOI Confer

✍ Sakai, H.; O'uchi, S.; Matsukawa, T.; Endo, K.; Liu, Y. X.; Tsukada, T.; Ishikaw 📂 Article 📅 2010 🏛 IEEE ⚖ 277 KB

[IEEE 2010 IEEE International SOI Confer

✍ Schrimpf, R. D.; Alles, M. L.; Fleetwood, D. M.; Ball, D. R.; Gadlage, M. J.; El 📂 Article 📅 2010 🏛 IEEE ⚖ 890 KB

[IEEE 2010 IEEE International SOI Confer

✍ Doria, R.T.; Pavanello, M.A.; Trevisoli, R.D.; de Souza, M.; Lee, C.W.; Ferain, 📂 Article 📅 2010 🏛 IEEE ⚖ 151 KB

[IEEE 2010 IEEE International SOI Confer

✍ Emam, M.; Vanhoenacker-Janvier, D.; Raskin, J.-P. 📂 Article 📅 2010 🏛 IEEE ⚖ 237 KB

[IEEE 2010 IEEE International SOI Confer

✍ Xu, S.G.; Zhang, H.P.; Wang, D.J.; Liu, G.H.; Niu, X.Y.; Lin, M.; Xu, L.Y. 📂 Article 📅 2010 🏛 IEEE ⚖ 710 KB