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[IEEE 2010 IEEE International SOI Conference - San Diego, CA, USA (2010.10.11-2010.10.14)] 2010 IEEE International SOI Conference (SOI) - High-frequency characterization of intrinsic FinFET channel

✍ Scribed by Sakai, H.; O'uchi, S.; Matsukawa, T.; Endo, K.; Liu, Y. X.; Tsukada, T.; Ishikawa, Y.; Nakagawa, T.; Sekigawa, T.; Koike, H.; Sakamoto, K.; Masahara, M.; Ishikuro, H.

Book ID: 118155282
Publisher: IEEE
Year: 2010
Weight: 277 KB
Volume: 0
Category: Article
ISBN: 1424491304
DOI: 10.1109/soi.2010.5641064

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