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[IEEE 2010 IEEE International SOI Conference - San Diego, CA, USA (2010.10.11-2010.10.14)] 2010 IEEE International SOI Conference (SOI) - High performance and low variability fully-depleted strained-SOI MOSFETs

✍ Scribed by Mazurier, J.; Weber, O.; Andrieu, F.; Allain, F.; Tabone, C.; Toffoli, A.; Fenouillet-Beranger, C.; Brevard, L.; Tosti, L.; Perreau, P.; Belleville, M.; Faynot, O.

Book ID: 118125903
Publisher: IEEE
Year: 2010
Weight: 667 KB
Volume: 0
Category: Article
ISBN: 1424491304
DOI: 10.1109/soi.2010.5641400

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