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Modeling and measurement of substrate coupling in Si-bipolar IC's up to 40 GHz

✍ Scribed by Pfost, M.; Rein, H.-M.

Book ID: 119775033
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 282 KB
Volume: 33
Category: Article
ISSN: 0018-9200
DOI: 10.1109/4.663563

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