Modeling and characterization of metal-semiconductor-metal-based source-drain contacts in amorphous InGaZnO thin film transistors

✍ Scribed by Lee, Sangwon; Park, Jun-Hyun; Jeon, Kichan; Kim, Sungchul; Jeon, Yongwoo; Kim, Dae Hwan; Kim, Dong Myong; Park, Jae Chul; Kim, Chang Jung

• Book ID: 125849789
• Publisher: American Institute of Physics
• Year: 2010
• Tongue: English
• Weight: 570 KB
• Volume: 96
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.3364134