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Modeling and Analysis of Leakage Currents in Double-Gate Technologies

✍ Scribed by Mukhopadhyay, S.; Keunwoo Kim; Ching Te Chuang; Roy, K.


Book ID
117907667
Publisher
IEEE
Year
2006
Tongue
English
Weight
879 KB
Volume
25
Category
Article
ISSN
0278-0070

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