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Gate leakage current partitioning in nanoscale double gate MOSFETs, using compact analytical model

✍ Scribed by Ghader Darbandy; François Lime; Antonio Cerdeira; Magali Estrada; Salvador Ivan Garduño; Benjamin Iñiguez


Book ID
116890887
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
538 KB
Volume
75
Category
Article
ISSN
0038-1101

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