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Mobility degradation and transistor asymmetry impact on field effect transistor access resistances extraction

✍ Scribed by J.C. Tinoco; A.G. Martinez-Lopez; J.-P. Raskin

Book ID: 108271834
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 296 KB
Volume: 56
Category: Article
ISSN: 0038-1101
DOI: 10.1016/j.sse.2010.10.020

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