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Minority carrier lifetime in the region close to the interface between the anodic oxide and CdHgTe

✍ Scribed by Toshiro Yamamoto; Yoshihiro Miyamoto; Kunihiro Tanikawa

Publisher: Elsevier Science
Year: 1985
Tongue: English
Weight: 354 KB
Volume: 72
Category: Article
ISSN: 0022-0248
DOI: 10.1016/0022-0248(85)90156-3

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