MIMC reliability and electrical behavior defined by a physical layer property of the dielectric

✍ Scribed by Ackaert, J.; Charavel, R.; Dhondt, K.; Vlachakis, B.; De Schepper, L.; Millecam, M.; Vandevelde, E.; Bogaert, P.; Iline, A.; De Backer, E.; Vlad, A.; Raskin, J.-P.

• Book ID: 108210768
• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 204 KB
• Volume: 48
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2008.06.043