✦ LIBER ✦
Improved interface properties and reliability for Hf-In-Zn-O semiconductor capacitors with an electric-double-layer gate dielectric by inserting a HfO2 interlayer
✍ Scribed by Zou, Xiao; Fang, Guojia; Qin, Pingli; Wang, Hongjiu; Song, Zengcai; Wang, Haoning; Long, Hao; Wan, Qing
- Book ID
- 123202503
- Publisher
- Elsevier Science
- Year
- 2013
- Tongue
- English
- Weight
- 871 KB
- Volume
- 540
- Category
- Article
- ISSN
- 0040-6090
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