Microwave reflection intensity measurement for dielectric material using a single probe
β Scribed by Hirofumi Kakemoto; Satoshi Wada; Takaaki Tsurumi
- Book ID
- 108170138
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 266 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0955-2219
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
## Abstract For in situ measurement of the complex permittivity of planar materials, a freeβspace system based on reflection or transmission ellipsometry has been developed and extended to microwave frequencies. Different angles of incidence were studied in the range [35β50Β°]. Original numerical me
## Abstract The design of a cavity resonator implies to solve the Maxwell equations inside that cavity, respecting the boundary conditions. As a consequence, the resonance frequencies appear as conditions in the solutions of the differential equation involved. The measurement of the complex permitt