✦ LIBER ✦

A new approach to estimate complex permittivity of dielectric materials at microwave frequencies using waveguide measurements

✍ Scribed by Deshpande, M.D.; Reddy, C.J.; Tiemsin, P.I.; Cravey, R.

Book ID: 111968068
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 510 KB
Volume: 45
Category: Article
ISSN: 0018-9480
DOI: 10.1109/22.563334

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Application of the FDTD method to determ

Application of the FDTD method to determine complex permittivity of dielectric materials at microwave frequencies using a rectangular waveguide

✍ Jaouad Terhzaz; Hassan Ammor; Abdelhadi Assir; Ahmed Mamouni 📂 Article 📅 2007 🏛 John Wiley and Sons 🌐 English ⚖ 394 KB 👁 1 views

## Abstract A new measurement technique is presented to determine the complex permittivity of a dielectric material. The dielectric sample is loaded in a short‐circuited rectangular waveguide. The reflection coefficient of the waveguide is measured by Network analyzer and calculated as a function o

Measurement of complex permittivity of l

Measurement of complex permittivity of low-loss dielectric material at 94 GHz frequency band using free-space method

✍ Kenjiro Otsuka; Osamu Hashimoto; Takahisa Ishida 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 96 KB 👁 1 views

The complex permitti¨ity of low-loss dielectric materials ( ) ABS and graft polymer in the 94 GHz band is measured using the free-space method. The ¨alidity of the free-space method at 94 GHz is confirmed, and the data of the complex permitti¨ity of these materials are presented.

A comparative study of four open-ended c

A comparative study of four open-ended coaxial probe models for permittivity measurements of lossy dielectric/biological materials at microwave frequencies

✍ Berube, D.; Ghannouchi, F.M.; Savard, P. 📂 Article 📅 1996 🏛 IEEE 🌐 English ⚖ 689 KB

Reflection and transmission ellipsometry

Reflection and transmission ellipsometry data analysis for measuring the complex permittivity of a single-layer material at microwave frequencies

✍ F. Sagnard; D. Seetharamdoo; V. Le Glaunec 📂 Article 📅 2002 🏛 John Wiley and Sons 🌐 English ⚖ 254 KB

## Abstract For in situ measurement of the complex permittivity of planar materials, a free‐space system based on reflection or transmission ellipsometry has been developed and extended to microwave frequencies. Different angles of incidence were studied in the range [35–50°]. Original numerical me