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Microwave Noise-Figure Measurement for Small Noise Output ( Correspondence)

✍ Scribed by Ishii, K.


Book ID
114656507
Publisher
IEEE
Year
1962
Tongue
English
Weight
220 KB
Volume
10
Category
Article
ISSN
0018-9480

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## Abstract A fast and accurate method to determine the noise parameters of microwave FETs, based on a new expression of the device noise figure as a function of the __Y__‐parameters and two equivalent noise temperatures, is presented. The method requires only the measured small‐signal parameters a