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Determination of Microwave Transistor Noise and Gain Parameters through Noise-Figure Measurements Only

✍ Scribed by Martines, G.; Sannino, M.


Book ID
114658020
Publisher
IEEE
Year
1982
Tongue
English
Weight
520 KB
Volume
30
Category
Article
ISSN
0018-9480

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## Abstract A fast and accurate method to determine the noise parameters of microwave FETs, based on a new expression of the device noise figure as a function of the __Y__‐parameters and two equivalent noise temperatures, is presented. The method requires only the measured small‐signal parameters a