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Microvoids in a-Si:H and a-SiGe:H alloys

โœ Scribed by S. Muramatsu; R. Suzuki; L. Wei; S. Tanigawa


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
347 KB
Volume
34
Category
Article
ISSN
0927-0248

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Why the photoconductivity decreases in a
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IR, pbotoconductivity, Raman and photothermal deflection spectroscopy measurements were used to probe the relationship between material quality and the amount of microsl~ucture in glow discharge deposited a-SiC:H and a-SiGe:H films. We find that the microstructure is directly responsible for the dec