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Why the photoconductivity decreases in a-SiC:H and a-SiGe:H when the amount of alloying increases

โœ Scribed by A.H. Mahan; P. Raboisson; P. Menna; A. Mascarenhas; R. Tsu


Publisher
Elsevier Science
Year
1988
Weight
448 KB
Volume
24
Category
Article
ISSN
0379-6787

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โœฆ Synopsis


IR, pbotoconductivity, Raman and photothermal deflection spectroscopy measurements were used to probe the relationship between material quality and the amount of microsl~ucture in glow discharge deposited a-SiC:H and a-SiGe:H films. We find that the microstructure is directly responsible for the decrease in photoconductivity observed in both alloys as a function of increased alloy content. The microstrucmre does this by causing a decrease in the steepness of the Urbach tail, thus allowing for an increase in both carrier trapping at the wider band edges and carrier recombination at or near the band tails.


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