Microstructure evolution of Bi0.4Ca0.6MnO3 epitaxial films with different thickness
β Scribed by Y.H. Ding; R.S. Cai; Q.T. Du; Y.Q. Wang; Y.Z. Chen; J.R. Sun
- Book ID
- 104022312
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 953 KB
- Volume
- 317
- Category
- Article
- ISSN
- 0022-0248
No coin nor oath required. For personal study only.
β¦ Synopsis
Bi 0.4 Ca 0.6 MnO 3 (BCMO) film was epitaxially grown on a (1 1 0) SrTiO 3 substrate using the pulsed laser ablation technique. The morphologies of the epitaxial films with different thicknesses were considerably different. For the Bi 0.4 Ca 0.6 MnO 3 epitaxial film with a thickness of 10 nm, the morphology was more like islands. As the film thickness increased to 40 nm, the island became smaller, and disappeared when the film thickness reached 110 nm. The growth mechanism of the epitaxial films depends on film thickness, which has been discussed. The results will shed light on the formation mechanism of BCMO epitaxial films.
π SIMILAR VOLUMES
## Abstract Resistance switching effect caused by external electric field was investigated in Pr~0.7~Ca~0.3~MnO~3~ (PCMO) thin films grown on (001)βoriented LaAlO~3~, by using different metallic (Al, Pt, Au, Ti) electrodes. When Al was used as one or both of the electrodes, PCMO thin films exhibite
Epitaxial (TI,Bi)Srl.6Bao.4Ca2Cu309\_ 8 ((T1,Bi)-1223) thin films on (100) single crystal LamlO 3 substrates were successfully synthesized by a two-step procedure. The (TI,Bi)-1223 phase development in both air and argon was systematically investigated by X-ray diffraction. The microstructure and ep