An important correlation of 1223 phase development to film thickness has been found on the films made by laser ablation and post-annealing on (100) LaA103 single crystal substrate. X-ray diffraction (XRD) and transmission electron microscopy (TEM) were used to characterize the 1223 phase development
Superconductivity and microstructure of epitaxial (Tl,Bi)Sr1.6Ba0.4Ca2Cu3O9−δ thin films
✍ Scribed by C.A. Wang; Z.F. Ren; J.H. Wang; D.J. Miller
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 593 KB
- Volume
- 245
- Category
- Article
- ISSN
- 0921-4534
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✦ Synopsis
Epitaxial (TI,Bi)Srl.6Bao.4Ca2Cu309_ 8 ((T1,Bi)-1223) thin films on (100) single crystal LamlO 3 substrates were successfully synthesized by a two-step procedure. The (TI,Bi)-1223 phase development in both air and argon was systematically investigated by X-ray diffraction. The microstructure and epitaxial relationship between films and substrates were measured by X-ray ~b scan, transmission electron microscopy (TEM), and scanning electron microscopy (SEM). The DC resistance versus temperature transition, zero-field-cooled (ZFC) and field-cooled (FC) magnetization transition, hysteresis curve, and transport critical current density were measured. The zero-resistance transition temperature was 107 K, and the critical current density at 77 K and zero field was higher than 2 × 106 A/em 2. (TI,Bi)-1223 films have good flux-pinning properties as shown by the slow decrease of the critical current density in an external magnetic field.
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Pr 0.4 Ca 0.6 Ba 2 Cu 3 O 7Àd thin films have been grown on SrTiO 3 (STO) substrates by pulsed laser deposition. The dependence of growth orientation and superconducting properties on substrate temperature were studied. As characterized by X-ray diffraction (XRD), good quality c-axis and a-axis orie