𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Superconductivity in Pr0.4Ca0.6Ba2Cu3O7−δ epitaxial thin films

✍ Scribed by S.L. Li; J.Y. Xiang; J. Li; P. Wang; R.L. Wang; D.H. Lin; D.N. Zheng

Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
410 KB
Volume
460-462
Category
Article
ISSN
0921-4534

No coin nor oath required. For personal study only.

✦ Synopsis

Pr 0.4 Ca 0.6 Ba 2 Cu 3 O 7Àd thin films have been grown on SrTiO 3 (STO) substrates by pulsed laser deposition. The dependence of growth orientation and superconducting properties on substrate temperature were studied. As characterized by X-ray diffraction (XRD), good quality c-axis and a-axis orientated films could be grown on STO by changing the substrate temperature. However, the highest T C0 ($16.8 K) was observed in samples with mixed orientations. Almost all samples exhibited a semiconducting-like temperature dependence of resistivity, which could be attributed to the scattering due to the localized electronic states. Furthermore, films grown on LAO, MgO and YSZ substrates were also studied.

📜 SIMILAR VOLUMES

Superconductivity and microstructure of
Superconductivity and microstructure of epitaxial (Tl,Bi)Sr1.6Ba0.4Ca2Cu3O9−δ thin films
✍ C.A. Wang; Z.F. Ren; J.H. Wang; D.J. Miller 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 593 KB

Epitaxial (TI,Bi)Srl.6Bao.4Ca2Cu309\_ 8 ((T1,Bi)-1223) thin films on (100) single crystal LamlO 3 substrates were successfully synthesized by a two-step procedure. The (TI,Bi)-1223 phase development in both air and argon was systematically investigated by X-ray diffraction. The microstructure and ep

Superconductivity and microstructural ch
Superconductivity and microstructural characterization of epitaxial (Tl,Bi)Sr1.6Ba0.4Ca2Cu3O9 − δ films
✍ Z.F. Ren; C.A. Wang; J.H. Wang; D.J. Miller 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 506 KB

An important correlation of 1223 phase development to film thickness has been found on the films made by laser ablation and post-annealing on (100) LaA103 single crystal substrate. X-ray diffraction (XRD) and transmission electron microscopy (TEM) were used to characterize the 1223 phase development