Microstructure characterization of titanium-base aluminium alloys by X-ray diffraction using Warren–Averbach and Rietveld method

✍ Scribed by J. Ghosh; S.K. Chattopadhayay; A.K. Meikap; S.K. Chatterjee

• Book ID: 116601675
• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 449 KB
• Volume: 453
• Category: Article
• ISSN: 0925-8388
• DOI: 10.1016/j.jallcom.2006.11.125