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Microstructural characterization of γ-TiAl base alloy by electron probe x-ray microanalysis and electron backscatter diffraction

✍ Scribed by L. Levin; A. Tokar; A. Berner

Book ID: 110217092
Publisher: Springer
Year: 2000
Tongue: English
Weight: 586 KB
Volume: 35
Category: Article
ISSN: 0022-2461
DOI: 10.1023/a:1004897801670

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