✦ LIBER ✦
Structural and microstructural characterization of Bi2Te3 films deposited by the close space vapor transport method using scanning electron microscopy and X-ray diffraction techniques
✍ Scribed by Francisco Cruz-Gandarilla; Osvaldo Vigil-Galán; Jose Gerardo Cabañas-Moreno; Jorge Sastré-Hernández; Francois Roy
- Book ID
- 113937555
- Publisher
- Elsevier Science
- Year
- 2012
- Tongue
- English
- Weight
- 971 KB
- Volume
- 520
- Category
- Article
- ISSN
- 0040-6090
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