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Microstructure and temperature dependence of microwave penetration depth of Ag doped Y1Ba2Cu3O7−x thin films

✍ Scribed by Davinder Kaur; S.P. Pai; J. Jesudasan; R. Pinto

Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
380 KB
Volume
405
Category
Article
ISSN
0921-4534

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