Temperature dependence of the penetration depth in epitaxial Y1Ba2Cu3O7−x thin films
✍ Scribed by V.A. Gasparov; A.P. Oganesyan
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 300 KB
- Volume
- 178
- Category
- Article
- ISSN
- 0921-4534
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✦ Synopsis
A novel technique for measuring the temperature dependence of the penetration depth 2 (T) for HTSC films has been demonstrated using the resonance frequency of the LC circuit with a one-pancake spiral coil. The 2(T) dependence is in agreement with two-coil mutual inductance method data and with BCS theory and the Gorter-Casimir two-fluid model. A difference between Tc as determined from the 2 (T) and p (T) dependences is observed.
📜 SIMILAR VOLUMES
We report radio-frequency surface-impedance measurements on high-quality single crystals of Y,Ba2Cu3Ov\_6, which exhibit a very sharp superconducting transition (AT< 0.3 K). We found a frequency dependence neither of the skin depth in the normal state dn, nor of~.(T). The temperature dependence of t
The surface impedance of several c-axis oriented YBa2Cu3O7 thin-film samples was measured in a copper host cavity at 87 GHz between 4.2 K and 300 K. High aualitv films between 0.17 urn and 0.8 um In thickness have been grown epitaxially on SrTiO3 by pulsed excimer laser~ablation. The partial penetra