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A comparative study on the microwave penetration depth of various Y1Ba2Cu3O7−δ thin films using a non-contact method

✍ Scribed by Sang Young Lee; G.B. Kim; S.T. Lim; W.N. Kang; T.S. Hahn; S.S. Choi; B. Oh; Y.W. Choi; S.H. Moon; A.G. Denisov

Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
556 KB
Volume
244
Category
Article
ISSN
0921-4534

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