Thin films of zinc telluride (ZnTe) were electrosynthesized on tin oxide coated conducting glass substrates at various bath temperatures. The deposited films were characterized by x-ray diffraction (XRD) and scanning electron microscopy (SEM). The structure was found to be cubic with preferential or
Microstructure and growth of ZnTe films
โ Scribed by Chaudhuri, Subhadra ;Mondal, Abdulla ;Pal, Arun Kumar
- Publisher
- Wiley (John Wiley & Sons)
- Year
- 1990
- Tongue
- English
- Weight
- 827 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0741-0581
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โฆ Synopsis
The microstructure and growth of ZnTe films deposited onto glass and freshly cleaved NaCl substrates are carefully studied by a TEM. Effect of different stimulator on the grain growth is also described.
Stimulator, Polycrystalline, Grain growth
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Different thickness of polycrystalline ZnTe films have been deposited onto glass substrates at room temperature by vacuum evaporation technique. The structural characteristics studied by X-ray diffraction (XRD) showed that the films are polycrystalline and have a zinc blende (cubic) structure. The c
We have grown short-period Z&e-ZnTe superlattices using low-pressure MOVPE. The influence of the growth parameters was investigated in detail. Combination of optical characterization with a tight-binding calculation gives a value of 200 meV for the strain-free valence band offset.