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Microstructural evolution of Sn-rich Au–Sn/Ni flip-chip solder joints under high temperature storage testing conditions

✍ Scribed by Jeong-Won Yoon; Hyun-Suk Chun; Ja-Myeong Koo; Hoo-Jeong Lee; Seung-Boo Jung


Book ID
113896564
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
494 KB
Volume
56
Category
Article
ISSN
1359-6462

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