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The influence of Sn–Cu–Ni(Au) and Sn–Au intermetallic compounds on the solder joint reliability of flip chips on low temperature co-fired ceramic substrates

✍ Scribed by N. Duan; J. Scheer; J. Bielen; M. van Kleef


Book ID
108361975
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
793 KB
Volume
43
Category
Article
ISSN
0026-2714

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