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Microstructural changes in amorphous Si/crystalline Al thin bilayer films upon annealing

✍ Scribed by Y.H. Zhao; J.Y. Wang; E.J. Mittemeijer

Book ID
106018969
Publisher
Springer
Year
2004
Tongue
English
Weight
869 KB
Volume
79
Category
Article
ISSN
1432-0630

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