Microscopic Investigation of a Copper Molten Mark by Optical Microscopy (OM) and Atomic Force Microscopy (AFM)

✍ Scribed by GAO Ao; ZHAO Chang-zheng; DI Man; GAO Wei; ZHANG Ming; XIA Da-wei

• Publisher: Elsevier
• Year: 2011
• Tongue: English
• Weight: 556 KB
• Volume: 11
• Category: Article
• ISSN: 1877-7058
• DOI: 10.1016/j.proeng.2011.04.633

✦ Synopsis

A wide variety of physical and chemical detecting methods have been proposed for discriminating between and electric arc bead that caused a fire, versus one that was caused by the fire itself. The simplest proposed method claims that examination of the molten marks in a bead under a microscope will suffice to make the distinction. Generally, copper molten marks of the bead are examined by using optical (OM) and scanning electron microscopy (SEM). In this paper, OM and AFM were employed to investigate a molten mark formed in laboratory. AFM observation reveals that AFM could be an auxiliary method to investigate the copper molten mark formed in the fire in order to confirm the reasons of the fire.