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Microanalyses of the reverse-bias leakage current increase in the laser lift off GaN-based light emitting diodes

✍ Scribed by Sun, Yongjian; Yu, Tongjun; Zhao, Huabo; Shan, Xudong; Zhang, Xinzheng; Chen, Zhizhong; Kang, Xiangning; Yu, Dapeng; Zhang, Guoyi

Book ID: 121761758
Publisher: American Institute of Physics
Year: 2009
Tongue: English
Weight: 459 KB
Volume: 106
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.3159015

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