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Micro-Raman Temperature Measurements for Electric Field Assessment in Active AlGaN–GaN HFETs

✍ Scribed by Rajasingam, S.; Pomeroy, J.W.; Kuball, M.; Uren, M.J.; Martin, T.; Herbert, D.C.; Hilton, K.P.; Balmer, R.S.

Book ID: 119956323
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 105 KB
Volume: 25
Category: Article
ISSN: 0741-3106
DOI: 10.1109/LED.2004.830267

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