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Micro Raman study of dislocations in n-type doped GaAs

โœ Scribed by O. Paetzold; G. Irmer; J. Monecke; S. Griehl; O. Oettel


Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
504 KB
Volume
24
Category
Article
ISSN
0377-0486

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