𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Micro-raman stress investigations and X-ray diffraction analysis of polycrystalline diamond (PCD) tools

✍ Scribed by Catledge, Shane A.; Vohra, Yogesh K.; Ladi, Ram; Rai, Ghanshyam

Book ID
122468394
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
572 KB
Volume
5
Category
Article
ISSN
0925-9635

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Residual stresses and crystalline qualit
Residual stresses and crystalline quality of heavily boron-doped diamond films analysed by micro-Raman spectroscopy and X-ray diffraction
✍ N.G Ferreira; E Abramof; E.J Corat; V.J Trava-Airoldi πŸ“‚ Article πŸ“… 2003 πŸ› Elsevier Science 🌐 English βš– 124 KB

X-ray diffraction analysis and micro-Raman spectroscopy measurements have been used for stress studies on HFCVD 18 21 diamond films with different levels of boron doping. The boron incorporation in the film varied in the range 10 -10 3 boron / cm . The grain size, obtained from SEM images, showed gr

Raman spectroscopic and X-ray investigat
Raman spectroscopic and X-ray investigation of stressed states in diamond-like carbon films
✍ R. Krawietz; B. KΓ€mpfe; E. Auerswald; M. BrΓΌcher πŸ“‚ Article πŸ“… 2004 πŸ› John Wiley and Sons 🌐 English βš– 309 KB πŸ‘ 1 views

## Abstract The non‐destructive characterization of intrinsic stress is very important to evaluate the reliability of devices based on diamond‐like carbon (DLC) films. Whereas the only requirement for the X‐ray diffraction method is a crystalline state of specimen, Raman spectroscopic stress analys