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X-ray diffraction and micro-Raman spectroscopy analysis of new nickel hydroxide obtained by electrodialysis

โœ Scribed by S. Deabate; F. Fourgeot; F. Henn

Book ID
108455005
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
645 KB
Volume
87
Category
Article
ISSN
0378-7753

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X-ray diffraction analysis and micro-Raman spectroscopy measurements have been used for stress studies on HFCVD 18 21 diamond films with different levels of boron doping. The boron incorporation in the film varied in the range 10 -10 3 boron / cm . The grain size, obtained from SEM images, showed gr